Krishnan, S., Shi,, Y., Webb, RC., Ma, Y., Bastein, P., Crawford, KE., Manco, M., Kurniawan, J., Tir, E., Huang, Y., Balooch, G., Pielak, RM., Rogers, JA.* Microsystems and Nanoengineering 2017, 3, 17014. DOI: 10.1038/micronano.2017.14